TY - JOUR
T1 - Digital image correlation for surface deformation measurement
T2 - Historical developments, recent advances and future goals
AU - Pan, Bing
N1 - Publisher Copyright:
© 2018 IOP Publishing Ltd.
PY - 2018/6/28
Y1 - 2018/6/28
N2 - This article is a personal review of the historical developments of digital image correlation (DIC) techniques, together with recent important advances and future goals. The historical developments of DIC techniques over the past 35 years are divided into a foundation-laying phase (1982-1999) and a boom phase (2000 to the present), and are traced by describing some of the milestones that have enabled new and/or better DIC measurements to be made. Important advances made to DIC since 2010 are reviewed, with an emphasis on new insights into the 2D-DIC system, new improvements to the correlation algorithm, and new developments in stereo-DIC systems. A summary of the current state-of-the-art DIC techniques is provided. Some further improvements that are needed and the future goals in the field are also envisioned.
AB - This article is a personal review of the historical developments of digital image correlation (DIC) techniques, together with recent important advances and future goals. The historical developments of DIC techniques over the past 35 years are divided into a foundation-laying phase (1982-1999) and a boom phase (2000 to the present), and are traced by describing some of the milestones that have enabled new and/or better DIC measurements to be made. Important advances made to DIC since 2010 are reviewed, with an emphasis on new insights into the 2D-DIC system, new improvements to the correlation algorithm, and new developments in stereo-DIC systems. A summary of the current state-of-the-art DIC techniques is provided. Some further improvements that are needed and the future goals in the field are also envisioned.
KW - 2D-digital image correlation
KW - displacement/strain measurement
KW - stereo-digital image correlation
UR - https://www.scopus.com/pages/publications/85050390308
U2 - 10.1088/1361-6501/aac55b
DO - 10.1088/1361-6501/aac55b
M3 - 文献综述
AN - SCOPUS:85050390308
SN - 0957-0233
VL - 29
JO - Measurement Science and Technology
JF - Measurement Science and Technology
IS - 8
M1 - 082001
ER -