TY - GEN
T1 - Detecting the number of EMI sources based on higher order statistics
AU - Zhenfei, Song
AU - Donglin, Su
AU - Shuguo, Xie
PY - 2009
Y1 - 2009
N2 - A new method for electromagnetic compatibility (EMC) fault diagnosis based on blind source separation (BSS) proposed in this paper. Higher order statistics (HOS) method is used to detect the number of electromagnetic interference (EMI) sources. Differing from normal analysis, the new method is performed in frequency domain considering the characteristics of EMC problem. Simulation shows better noise immunity of the new method, and the feasibility is verified by using EMI Measurement data. This new method provides a new way for EMC fault diagnosis.
AB - A new method for electromagnetic compatibility (EMC) fault diagnosis based on blind source separation (BSS) proposed in this paper. Higher order statistics (HOS) method is used to detect the number of electromagnetic interference (EMI) sources. Differing from normal analysis, the new method is performed in frequency domain considering the characteristics of EMC problem. Simulation shows better noise immunity of the new method, and the feasibility is verified by using EMI Measurement data. This new method provides a new way for EMC fault diagnosis.
UR - https://www.scopus.com/pages/publications/64249091847
U2 - 10.1109/EMCZUR.2009.4783491
DO - 10.1109/EMCZUR.2009.4783491
M3 - 会议稿件
AN - SCOPUS:64249091847
SN - 9783952328668
T3 - Proceedings of the 20th International Zurich Symposium on Electromagnetic Compatibility, EMC Zurich 2009
SP - 465
EP - 468
BT - Proceedings of the 20th International Zurich Symposium on Electromagnetic Compatibility, EMC Zurich 2009
T2 - 20th International Zurich Symposium on Electromagnetic Compatibility, EMC Zurich 2009
Y2 - 12 January 2009 through 16 January 2009
ER -