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Detecting Condition-Related Bugs with Control Flow Graph Neural Network

  • Beihang University
  • Zhongguancun Laboratory
  • Chongqing University
  • Nanyang Technological University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Automated bug detection is essential for high-quality software development and has attracted much attention over the years. Among the various bugs, previous studies show that the condition expressions are quite error-prone and the condition-related bugs are commonly found in practice. Traditional approaches to automated bug detection are usually limited to compilable code and require tedious manual effort. Recent deep learning-based work tends to learn general syntactic features based on Abstract Syntax Tree (AST) or apply the existing Graph Neural Networks over program graphs. However, AST-based neural models may miss important control flow information of source code, and existing Graph Neural Networks for bug detection tend to learn local neighbourhood structure information. Generally, the condition-related bugs are highly influenced by control flow knowledge, therefore we propose a novel CFG-based Graph Neural Network (CFGNN) to automatically detect condition-related bugs, which includes a graph-structured LSTM unit to efficiently learn the control flow knowledge and long-distance context information. We also adopt the API-usage attention mechanism to leverage the API knowledge. To evaluate the proposed approach, we collect real-world bugs in popular GitHub repositories and build a large-scale condition-related bug dataset. The experimental results show that our proposed approach significantly outperforms the state-of-the-art methods for detecting condition-related bugs.

源语言英语
主期刊名ISSTA 2023 - Proceedings of the 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis
编辑Rene Just, Gordon Fraser
出版商Association for Computing Machinery, Inc
1370-1382
页数13
ISBN(电子版)9798400702211
DOI
出版状态已出版 - 12 7月 2023
活动32nd ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2023 - Seattle, 美国
期限: 17 7月 202321 7月 2023

丛书

姓名ISSTA 2023 - Proceedings of the 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis

会议

会议32nd ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2023
国家/地区美国
Seattle
时期17/07/2321/07/23

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