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Destructive electronics from electrochemical-mechanically triggered chemical dissolution

  • Kyoseung Sim
  • , Xu Wang
  • , Yuhang Li
  • , Changhong Linghu
  • , Yang Gao
  • , Jizhou Song
  • , Cunjiang Yu
  • University of Houston
  • Zhejiang University
  • East China University of Science and Technology

科研成果: 期刊稿件 › 文章 › 同行评审

摘要

The considerable need to enhance data and hardware security suggest one possible future for electronics where it is possible to destroy them and even make them disappear physically. This paper reports a type of destructive electronics which features fast transience from chemical dissolution on-demand triggered in an electrochemical-mechanical manner. The detailed materials, mechanics, and device construction of the destructive electronics are presented. Experiment and analysis of the triggered releasing and transience study of electronic materials, resistors and metal-oxide-semiconductor field effect transistors illustrate the key aspects of the destructive electronics. The reported destructive electronics is useful in a wide range of areas from security and defense, to medical applications.

源语言英语
期刊论文编号065010
期刊Journal of Micromechanics and Microengineering
卷27
期6
DOI
出版状态已出版 - 8 5月 2017

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