跳到主要导航 跳到搜索 跳到主要内容

Design of compliant parallel mechanism for Nanoimprint Lithography

  • Xiantao Sun*
  • , Weihai Chen
  • , Rui Zhou
  • , Jianbin Zhang
  • , Wenjie Chen
  • *此作品的通讯作者
  • Beihang University
  • Agency for Science, Technology and Research, Singapore

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

摘要

Nanoimprint Lithography (NIL) is an emerging alternative lithography technology that can be repeated to print nanometer-scale geometries which have very good uniformity and repeatability. The compliant mechanism is a novel mechanism which has been utilized in many accurate mechanisms and precise instruments because of its obvious advantages such as easy assembly, zero friction, zero lubrication, low cost, monolithic manufacturing and reduced weight, etc. This paper mainly introduces the application of compliant mechanisms in NIL and analysis and design of several novel compliant mechanisms.

源语言英语
主期刊名Proceedings of the 2011 6th IEEE Conference on Industrial Electronics and Applications, ICIEA 2011
页200-205
页数6
DOI
出版状态已出版 - 2011
活动2011 6th IEEE Conference on Industrial Electronics and Applications, ICIEA 2011 - Beijing, 中国
期限: 21 6月 2011 → 23 6月 2011

丛书

姓名Proceedings of the 2011 6th IEEE Conference on Industrial Electronics and Applications, ICIEA 2011

会议

会议2011 6th IEEE Conference on Industrial Electronics and Applications, ICIEA 2011
国家/地区中国
市Beijing
时期21/06/11 → 23/06/11

学术指纹

探究 'Design of compliant parallel mechanism for Nanoimprint Lithography' 的科研主题。它们共同构成独一无二的学术指纹。

引用此