TY - GEN
T1 - Design of big data processing system for spacecraft testing experiment
AU - Sun, Bo
AU - Zhang, Lei
AU - Chen, Yongheng
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/7/1
Y1 - 2017/7/1
N2 - The ground and in-orbit testing experiment of spacecraft are of great significance to the development of China's space industry, and processing the data of testing experiment is an indispensable part in it. In order to solve the problem of large data volume, complex data structure and long time needed for analysis in the testing experiment of spacecraft, a big data processing system of testing experiment is designed based on the mainstream big data processing technology. It stores the test data in the distributed file system of the computer cluster, and uses the memory computing technology to realize parallel processing of the experimental data. This system can greatly reduce the time needed to process experimental data, improve the efficiency of the spacecraft testing experiment, and has a good application prospect in the field of spacecraft test.
AB - The ground and in-orbit testing experiment of spacecraft are of great significance to the development of China's space industry, and processing the data of testing experiment is an indispensable part in it. In order to solve the problem of large data volume, complex data structure and long time needed for analysis in the testing experiment of spacecraft, a big data processing system of testing experiment is designed based on the mainstream big data processing technology. It stores the test data in the distributed file system of the computer cluster, and uses the memory computing technology to realize parallel processing of the experimental data. This system can greatly reduce the time needed to process experimental data, improve the efficiency of the spacecraft testing experiment, and has a good application prospect in the field of spacecraft test.
KW - big data
KW - memory computing technology
KW - parallel processing
KW - tesing experiment
UR - https://www.scopus.com/pages/publications/85049520993
U2 - 10.1109/MAPE.2017.8250823
DO - 10.1109/MAPE.2017.8250823
M3 - 会议稿件
AN - SCOPUS:85049520993
T3 - Proceedings of 2017 7th IEEE International Symposium on Microwave, Antenna, Propagation, and EMC Technologies, MAPE 2017
SP - 164
EP - 167
BT - Proceedings of 2017 7th IEEE International Symposium on Microwave, Antenna, Propagation, and EMC Technologies, MAPE 2017
A2 - Wen, Yinghong
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 7th IEEE International Symposium on Microwave, Antenna, Propagation, and EMC Technologies, MAPE 2017
Y2 - 24 October 2017 through 27 October 2017
ER -