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Deep transfer metric learning

  • Junlin Hu
  • , Jiwen Lu*
  • , Yap Peng Tan
  • *此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Conventional metric learning methods usually assume that the training and test samples are captured in similar scenarios so that their distributions are assumed to be the same. This assumption doesn't hold in many real visual recognition applications, especially when samples are captured across different datasets. In this paper, we propose a new deep transfer metric learning (DTML) method to learn a set of hierarchical nonlinear transformations for cross-domain visual recognition by transferring discriminative knowledge from the labeled source domain to the unlabeled target domain. Specifically, our DTML learns a deep metric network by maximizing the inter-class variations and minimizing the intra-class variations, and minimizing the distribution divergence between the source domain and the target domain at the top layer of the network. To better exploit the discriminative information from the source domain, we further develop a deeply supervised transfer metric learning (DSTML) method by including an additional objective on DTML where the output of both the hidden layers and the top layer are optimized jointly. Experimental results on cross-dataset face verification and person re-identification validate the effectiveness of the proposed methods.

源语言英语
主期刊名IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2015
出版商IEEE Computer Society
325-333
页数9
ISBN(电子版)9781467369640
DOI
出版状态已出版 - 14 10月 2015
已对外发布
活动IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2015 - Boston, 美国
期限: 7 6月 201512 6月 2015

出版系列

姓名Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
07-12-June-2015
ISSN(印刷版)1063-6919

会议

会议IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2015
国家/地区美国
Boston
时期7/06/1512/06/15

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