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CORN: In-Buffer Computing for Binary Neural Network

  • Beihang University
  • University of California at Santa Barbara

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Binary Neural Networks (BNNs) have obtained great attention since they reduce memory usage and power consumption as well as achieve a satisfying recognition accuracy on Image Classification. In particular to the computation of BNNs, the multiply-accumulate operations of convolution-layer are replaced with the bit-wise operations (XNOR and pop-count). Such bit-wise operations are well suited for the hardware accelerator such as in-memory computing (IMC). However, an additional digital processing unit (DPU) is required for the pop-count operation, which induces considerable data movement between the Process Engines (PEs) and data buffers reducing the efficiency of the IMC. In this paper, we present a BNN computing accelerator, namely CORN, which consists of a Spin-Orbit-Torque Magnetic RAM (SOT-MRAM) based data buffer to perform the majority operation (to replace the pop-count process) with the SOT-MRAM-based IMC to accelerate the computing of BNNs. CORN can naturally implement the XNOR operation in the NVM memory array, and feed results to the computing data buffer for the majority write operation. Such a design removes the pop-counter implemented by the DPU and reduces data movement between the data buffer and the memory array. Based on the evaluation results, CORN achieves 61% and 14% power saving with 1.74× and 2.12× speedup, compared to the FPGA and DPU based IMC architecture, respectively.

源语言英语
主期刊名Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
出版商Institute of Electrical and Electronics Engineers Inc.
384-389
页数6
ISBN(电子版)9783981926323
DOI
出版状态已出版 - 14 5月 2019
活动22nd Design, Automation and Test in Europe Conference and Exhibition, DATE 2019 - Florence, 意大利
期限: 25 3月 201929 3月 2019

出版系列

姓名Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019

会议

会议22nd Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
国家/地区意大利
Florence
时期25/03/1929/03/19

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