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Component-based metric learning for fully automatic kinship verification

  • Huishan Wu
  • , Jiawei Chen
  • , Xiao Liu
  • , Junlin Hu*
  • *此作品的通讯作者
  • Beijing Language and Culture University
  • Beijing University of Chemical Technology

科研成果: 期刊稿件文章同行评审

摘要

This paper introduces a fully automatic method for kinship verification from facial images. Recently, a number of methods have been proposed to verify kinship from facial images, however, most of these methods are needed to exactly align face images before feature extraction in a manual manner. Unlike these methods, our method does not depend on face alignment. Firstly, we localize several facial feature points by utilizing a facial feature detector to extract SIFT descriptor around each feature point of a face image. Lastly, two ways, feature combination and distance metric learning, are used to verify the kinship of a pair of face images. For feature combination, three simple strategies of feature combination and support vector machine classifier are used for kinship verification. For metric learning, we propose a component-based metric learning (CML) method to measure the distance of each face pair, which jointly learns multiple local distance metrics, and one specific distance metric for each facial feature point. Experimental results show the effectiveness of our proposed approach on two popular kinship datasets.

源语言英语
期刊论文编号103265
期刊Journal of Visual Communication and Image Representation
79
DOI
出版状态已出版 - 8月 2021

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