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Competition between band gap and yellow luminescence in undoped GaN grown by MOVPE on sapphire substrate

  • H. Z. Xu*
  • , A. Bell
  • , Z. G. Wang
  • , Y. Okada
  • , M. Kawabe
  • , I. Harrison
  • , C. T. Foxon
  • *此作品的通讯作者

科研成果: 期刊稿件文章同行评审

摘要

Undoped GaN epilayer on c-face (0 0 0 1) sapphire substrate has been grown by metalorganic vapor-phase epitaxy (MOVPE) in a horizontal-type low-pressure two-channel reactor. Photoluminescence (PL) as a function of temperature and excitation intensity have been systematically studied, and the competition between near band gap ultraviolet (UV) and defect-related yellow luminescence (YL) has been extensively investigated. It is revealed that the ratio of the UV-to-YL peak intensities depends strongly on the excitation intensity and the measurement temperature. The obtained results have been analyzed in comparison with the theoretical predications based on a bimolecular model.

源语言英语
页(从-至)96-103
页数8
期刊Journal of Crystal Growth
222
1-2
DOI
出版状态已出版 - 1月 2001
已对外发布

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