Characterization of an Electrically Controlled Metamaterial Terahertz Modulator Using Dynamic Measurement Method

The characterization results of a typical electrically controlled metamaterial terahertz (THz) modulator obtained by the dynamic measurement method are presented and are in good agreement with the theoretical results predicted by a first-order model. The dynamic measurement method can characterize the modulation depth and modulation speed simultaneously. The reliability of the method is verified by terahertz time-domain spectroscopy (THz-TDS), and the current response method, which show that the more intuitive and comprehensive dynamic measurement method, can be used to characterize the electrically controlled metamaterial THz modulator accurately.