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Bivariate Reliability Evaluation Based on Semi-parametric Method Considering Degradation Dependencies and Random Effect

  • Yaohui Lu
  • , Rentong Chen*
  • , Chao Zhang
  • , Shaoping Wang
  • , Jiahui Sun
  • , Shanjian Liu
  • , Songjun Huang
  • *此作品的通讯作者
  • Beihang University
  • Research Institute

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

摘要

Accurate reliability evaluation is a crucial prerequisite for the development of maintenance strategies and the reduction of maintenance costs. However, the traditional parametric degradation modeling methods are difficult to address the challenges of unknown, complex and time-varying distribution of degradation increments, and most of the studies have not fully considered the bivariate reliability evaluation with degradation dependencies and unit-to-unit variability. To address above issues, this paper proposes a novel semi-parametric degradation model with degradation dependencies and random effect. Firstly, an improved log-change adaptive kernel density estimation (AKDE) method is developed to address the uncertainty of the degradation increment distribution and the boundary estimation bias. Secondly, the extrapolation prediction of degradation states is constructed based on two-dimensional AKDE. Furthermore, a semi-parametric bivariate reliability evaluation model is established based on the copula function, and the random effects are introduced into the copula function. In addition, a two-stage statistical inference method for unknown parameters estimation is developed. Finally, the wet-heat aging experiment of O-ring seals is used to verify the validity and accuracy of the proposed model. The results show that the proposed method outperforms the existing models. The proposed method provides a new idea for component reliability prediction with complex degradation mechanisms.

源语言英语
主期刊名2025 9th International Conference on System Reliability and Safety, ICSRS 2025
出版商Institute of Electrical and Electronics Engineers Inc.
页532-537
页数6
ISBN(电子版)9798331549527
DOI
出版状态已出版 - 2025
活动9th International Conference on System Reliability and Safety, ICSRS 2025 - Turin, 意大利
期限: 26 11月 2025 → 28 11月 2025

丛书

姓名2025 9th International Conference on System Reliability and Safety, ICSRS 2025

会议

会议9th International Conference on System Reliability and Safety, ICSRS 2025
国家/地区意大利
市Turin
时期26/11/25 → 28/11/25

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