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Bilateral Symmetry Detection in Perspective Based on Vanish Features

  • Key Laboratory of Precision Opto-Mechatronics Technology (Ministry of Education)

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Symmetry detection is an important research field in image analysis and computer vision. It plays an important role in object match, recognition and location. However, the change of perspective projection angle increases the difficulty of symmetry detection. Therefore, it is of great significance to detect the symmetry of objects under perspective projection. Current feature point-based methods mostly use multiple sets of matched point pairs to detect the symmetry axis line, which not only introduces massive calculation but also interference between feature point pairs. Hence, we propose a novel feature point match-based symmetry axes lines detection method of planar graphs in perspective. This approach detects matched pairs based on the BEBLID descriptor and AdaLAM mismatch removal, and adopts binocular cameras to get a potential symmetry axis line from a pair of matched points, avoiding the influence of other matched points. Experimental results show that this method can achieve accurate and efficient detection of symmetry axis.

源语言英语
主期刊名Proceedings of 2021 IEEE International Conference on Data Science and Computer Application, ICDSCA 2021
出版商Institute of Electrical and Electronics Engineers Inc.
534-537
页数4
ISBN(电子版)9781665440530
DOI
出版状态已出版 - 2021
已对外发布
活动2021 IEEE International Conference on Data Science and Computer Application, ICDSCA 2021 - Dalian, 中国
期限: 29 10月 202131 10月 2021

出版系列

姓名Proceedings of 2021 IEEE International Conference on Data Science and Computer Application, ICDSCA 2021

会议

会议2021 IEEE International Conference on Data Science and Computer Application, ICDSCA 2021
国家/地区中国
Dalian
时期29/10/2131/10/21

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