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Bayesian and degradation data based zero-failure accelerated life demonstration test for electrical products in high speed train system

  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

The electrical components are widely used in high speed trains. It is very important to verify their reliability with a lower cost. This paper proposed a Bayesian zero-failure accelerated life demonstration test with optimum design method to reduce the sample size under the cost constraints. This test design method takes consideration of the sampling risk, extrapolation risk and the acceleration risk. The acceleration risk is introduced to assess the risk caused by the uncertainty of the acceleration model. A Bayesian model is proposed to utilize the historical experiment statistic in order to reduce the sampling risky by means of the Gibbs algorithm. Then, a decision rule is carried out under the cost and the risk constraints. An application on the electrical power panel of the high-speed train system is presented. The results verify that the proposed method works efficiently in reducing the sample size under the risk and the cost constraints.

源语言英语
主期刊名2017 4th International Conference on Transportation Information and Safety, ICTIS 2017 - Proceedings
编辑Xinping Yan, Ming Zhong, Meng Lu, Chaozhong Wu, Zhijun Qiu, Zhaozheng Hu
出版商Institute of Electrical and Electronics Engineers Inc.
606-611
页数6
ISBN(电子版)9781538604373
DOI
出版状态已出版 - 20 9月 2017
活动4th International Conference on Transportation Information and Safety, ICTIS 2017 - Banff, 加拿大
期限: 8 8月 201710 8月 2017

出版系列

姓名2017 4th International Conference on Transportation Information and Safety, ICTIS 2017 - Proceedings

会议

会议4th International Conference on Transportation Information and Safety, ICTIS 2017
国家/地区加拿大
Banff
时期8/08/1710/08/17

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