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Bandwidth Characteristics of Mid-Wavelength Infrared PIN HgCdTe Avalanche Photodiodes

  • Yue Gu
  • , Runzhang Xie
  • , Peng Wang*
  • , Qing Li
  • , Yuanchen Zou
  • , Shuning Liu
  • , Kun Zhang
  • , Yang Wang
  • , Hailu Wang
  • , Fang Wang
  • , Lu Chen
  • , Weida Hu
  • *此作品的通讯作者
  • CAS - Shanghai Institute of Technical Physics
  • University of Chinese Academy of Sciences
  • Hangzhou Institute for Advanced Study
  • Shanghai University

科研成果: 期刊稿件文章同行评审

摘要

HgCdTe avalanche photodiodes (APDs) are used in mid-wavelength infrared (MWIR) photoelectric detectors in free-space optical communication, three-dimensional light detection, and ranging. Although HgCdTe has a small electronic effective mass and high mobility, there is a gap between the actual bandwidth of the device and the theoretical limit, and it is important to analyze the carrier transport mechanism in these devices. A two-dimensional finite element model is used to analyze the carrier transport mechanism for different device structures and bias voltages. The structural parameters of the device are optimized on the basis of a comprehensive determination of its bandwidth characteristics. Experimental data and calculation results are found to be consistent. This structural optimization increases the device bandwidth from 27.1 MHz to 553 MHz, with a gain-normalized dark current density (GNDCD) of less than 10-6 A/cm2. The results obtained here can provide guidance for the design of high-speed HgCdTe devices.

源语言英语
文章编号4500106
期刊IEEE Journal of Quantum Electronics
59
2
DOI
出版状态已出版 - 1 4月 2023
已对外发布

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