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Atomically Precise Bottom-Up Fabrication of Ultra-Narrow Semiconducting Zigzag BiP Nanoribbons

  • Dechun Zhou
  • , Yisui Feng
  • , Lei Zhang
  • , Wenjin Gao
  • , Heping Li
  • , Hui Li*
  • , Miao Zhou*
  • , Tianchao Niu*
  • *此作品的通讯作者
  • Beihang University
  • National University of Singapore
  • Beijing University of Chemical Technology
  • Tianmushan Laboratory

科研成果: 期刊稿件文章同行评审

摘要

1D semiconductors with atomically precise edge and well-controlled width hold significant promise as channel materials for next-generation electronics. Here a method to fabricate the narrowest zigzag-edged bismuth phosphide (BiP) nanoribbons (NRs) is presented, achieving widths of three atoms (≈0.7 nm), through molecular beam epitaxy on bismuthene in a wide P coverage range. Using scanning tunneling microscopy and first-principles calculations, it is revealed that these BiP NRs exhibit a blue-phosphorene-like structure, with a theoretical bandgap of 0.38 eV. Notably, first-principles calculations reveal spin-polarized states located on the zigzag edges, presenting an option for spintronics applications. Formation of these uniform BiP NRs is attributed to tensile strain from lattice-registry confinement. During epitaxial growth, P clusters act dually as feedstock and catalysts, suggesting a self-catalyzed growth mechanism. The bottom-up strategy offers an effective approach for the atomically precise fabrication of 1D BiP NRs, paving the way for the creation of diverse low-dimensional binary materials with tailored chemical and electronic properties, facilitated by selecting suitable elemental 2D materials as substrates.

源语言英语
文章编号2401347
期刊Advanced Functional Materials
34
36
DOI
出版状态已出版 - 4 9月 2024

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