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Atomically flat interface between a single-terminated LaAlO3 substrate and SrTiO3 thin film is insulating

  • Z. Q. Liu
  • , Z. Huang
  • , W. M. Lü
  • , K. Gopinadhan
  • , X. Wang
  • , A. Annadi
  • , T. Venkatesan
  • , Ariando*
  • *此作品的通讯作者
  • National University of Singapore

科研成果: 期刊稿件文章同行评审

摘要

The surface termination of (100)-oriented LaAlO3 (LAO) single crystals was examined by atomic force microscopy and optimized to produce a single-terminated atomically flat surface by annealing. Then the atomically flat STO film was achieved on a single-terminated LAO substrate, which is expected to be similar to the n-type interface of two-dimensional electron gas (2DEG), i.e., (LaO)-(TiO2). Particularly, that can serve as a mirror structure for the typical 2DEG heterostructure to further clarify the origin of 2DEG. This newly developed interface was determined to be highly insulating. Additionally, this study demonstrates an approach to achieve atomically flat film growth based on LAO substrates.

源语言英语
文章编号012147
期刊AIP Advances
2
1
DOI
出版状态已出版 - 3月 2012
已对外发布

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