摘要
Antiferroelectric materials are a kind of functional material, which are widely used in electrostatic energy storage, energy conversion devices, and magnetoelectric coupling devices. As a typical lead-free antiferroelectric material, silver niobate has attracted much attention in recent years due to its excellent performance in energy storage. In this work, using the spherical aberration corrected electron microscopy technique, atomic-resolution images of pure silver niobate were obtained, which revealed typical microscopic physical characteristics of such complex antiferroelectric oxides: in such materials, all cations deviate from the average positions of the main lattice, and the displacement of each kind of cation varies periodically in two opposite directions, resulting in periodic wavy (1-10) c atomic planes, and the period of cation displacement is 15.6 Å. At the same time, the 90° antiferroelectric domain boundary and the antiphase domain wall defects are further revealed and analyzed.
| 源语言 | 英语 |
|---|---|
| 文章编号 | 242901 |
| 期刊 | Applied Physics Letters |
| 卷 | 113 |
| 期 | 24 |
| DOI | |
| 出版状态 | 已出版 - 10 12月 2018 |
| 已对外发布 | 是 |
学术指纹
探究 'Atomic-scale structure characteristics of antiferroelectric silver niobate' 的科研主题。它们共同构成独一无二的学术指纹。引用此
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