Atomic resolution characterization of pt based bi-metallic nano-catalysts using aberration corrected STEM

G. Yang; G. Hu; S. Cheng; T. Wagberg

doi:10.1017/S1431927614004401

Atomic resolution characterization of pt based bi-metallic nano-catalysts using aberration corrected STEM

G. Yang
, G. Hu
, S. Cheng
, T. Wagberg

Xi'an Jiaotong University
Umeå University

科研成果: 期刊稿件 › 会议文章 › 同行评审

1 引用（Scopus）

源语言	英语
页（从-至）	536-537
页数	2
期刊	Microscopy and Microanalysis
卷	20
期	3
DOI	https://doi.org/10.1017/S1431927614004401
出版状态	已出版 - 1 8月 2014
已对外发布	是
活动	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, 美国期限: 3 8月 2014 → 7 8月 2014

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10.1017/S1431927614004401

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引用此

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title = "Atomic resolution characterization of pt based bi-metallic nano-catalysts using aberration corrected STEM",

author = "G. Yang and G. Hu and S. Cheng and T. Wagberg",

year = "2014",

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doi = "10.1017/S1431927614004401",

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journal = "Microscopy and Microanalysis",

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note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

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TY - JOUR

T1 - Atomic resolution characterization of pt based bi-metallic nano-catalysts using aberration corrected STEM

AU - Yang, G.

AU - Hu, G.

AU - Cheng, S.

AU - Wagberg, T.

PY - 2014/8/1

Y1 - 2014/8/1

UR - https://www.scopus.com/pages/publications/84927937131

U2 - 10.1017/S1431927614004401

DO - 10.1017/S1431927614004401

M3 - 会议文章

AN - SCOPUS:84927937131

SN - 1431-9276

VL - 20

SP - 536

EP - 537

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -