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ASTRA: Automatic Sizing of Transistors with Reasoning Agents

  • Wei W. Xing*
  • , Baowen Ou
  • , Yuxuan Zhang
  • , Zhuohua Liu
  • , Yuanqi Hu*
  • *此作品的通讯作者
  • University of Sheffield
  • Shenzhen University
  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Advancing technology nodes have significantly increased the complexity of transistor sizing in analog circuit design. Although artificial intelligence (AI) techniques show potential, their lack of integrated domain expertise often leads to slow convergence in practical applications. We propose ASTRA (Automatic Sizing of Transistors with Reasoning Agents), a novel optimization framework that implements the Model Context Protocol (MCP) to create structured reasoning pathways between Large Language Models (LLMs), domain knowledge bases, and Bayesian Optimization (BO). ASTRA introduces a two-stage process: first, MCP-guided design initialization that leverages Retrieval-Augmented Generation (RAG) to quickly identify feasible regions using gm/ID methodology; and second, BO-based optimization focused on critical transistors, identified through LLM reasoning with data-driven validation. A key innovation of ASTRA is its ability to seamlessly integrate with and enhance virtually any existing transistor sizing algorithm at minimal additional cost. Unlike purely data-driven or black-box LLM approaches, ASTRA maintains traceable decision processes that can be verified and refined. Evaluated on three real-world analog circuits, ASTRA enhances multiple classical optimization methods, achieving up to 4.35× fewer simulation iterations and 2.36× performance improvements, demonstrating its effectiveness as a general open-source framework for advancing analog circuit sizing.

源语言英语
主期刊名2025 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2025 - Conference Proceedings
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9798331515607
DOI
出版状态已出版 - 2025
活动44th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2025 - Munich, 德国
期限: 26 10月 202530 10月 2025

出版系列

姓名IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN(印刷版)1092-3152

会议

会议44th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2025
国家/地区德国
Munich
时期26/10/2530/10/25

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