TY - JOUR
T1 - Artificial Intelligence Enhanced Reliability Assessment Methodology With Small Samples
AU - Cai, Baoping
AU - Sheng, Chaoyang
AU - Gao, Chuntan
AU - Liu, Yonghong
AU - Shi, Mingwei
AU - Liu, Zengkai
AU - Feng, Qiang
AU - Liu, Guijie
N1 - Publisher Copyright:
© 2021 IEEE.
PY - 2023/9/1
Y1 - 2023/9/1
N2 - Due to the high price of the product and the limitation of laboratory conditions, reliability tests often get a small number of failed samples. If the data are not handled properly, the reliability evaluation results will incur grave errors. In order to solve this problem, this work proposes an artificial intelligence (AI) enhanced reliability assessment methodology by combining Bayesian neural networks (BNNs) and differential evolution (DE) algorithms. First, a single hidden layer BNN model is constructed by fusing small samples and prior information to obtain the 95% confidence interval (CI) of the posterior distribution. Then, the DE algorithm is used to iteratively generate optimal virtual samples based on the 95% CI and small samples trends. A reliability assessment model is reconstructed based on double hidden layers BNN model by combining virtual samples and test samples in the last stage. In order to verify the effectiveness of the proposed method, an accelerated life test (ALT) of the subsurface electronic control unit (S-ECU) was carried out. The verification test results show that the proposed method can accurately evaluate the reliability life of a product. And compared with the two existing methods, the results show that this method can effectively improve the accuracy of the reliability assessment of a test product.
AB - Due to the high price of the product and the limitation of laboratory conditions, reliability tests often get a small number of failed samples. If the data are not handled properly, the reliability evaluation results will incur grave errors. In order to solve this problem, this work proposes an artificial intelligence (AI) enhanced reliability assessment methodology by combining Bayesian neural networks (BNNs) and differential evolution (DE) algorithms. First, a single hidden layer BNN model is constructed by fusing small samples and prior information to obtain the 95% confidence interval (CI) of the posterior distribution. Then, the DE algorithm is used to iteratively generate optimal virtual samples based on the 95% CI and small samples trends. A reliability assessment model is reconstructed based on double hidden layers BNN model by combining virtual samples and test samples in the last stage. In order to verify the effectiveness of the proposed method, an accelerated life test (ALT) of the subsurface electronic control unit (S-ECU) was carried out. The verification test results show that the proposed method can accurately evaluate the reliability life of a product. And compared with the two existing methods, the results show that this method can effectively improve the accuracy of the reliability assessment of a test product.
KW - Accelerated life test (ALT)
KW - Bayesian neural networks (BNNs)
KW - differential evolution (DE) algorithm
KW - reliability assessment
KW - small samples
UR - https://www.scopus.com/pages/publications/85120547686
U2 - 10.1109/TNNLS.2021.3128514
DO - 10.1109/TNNLS.2021.3128514
M3 - 文章
C2 - 34822332
AN - SCOPUS:85120547686
SN - 2162-237X
VL - 34
SP - 6578
EP - 6590
JO - IEEE Transactions on Neural Networks and Learning Systems
JF - IEEE Transactions on Neural Networks and Learning Systems
IS - 9
ER -