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Application of 3d models in intelligent visual inspection of product anomalies

  • Feifei Kong
  • , Yunxia Lu
  • , Fuzhou Du*
  • *此作品的通讯作者
  • Beihang University
  • Beijing Satellite Manufacturing Factory Co., Ltd.

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

摘要

Due to its advantages of non-contact, high efficiency, and digitization, machine vision has been extensively utilized in product appearance anomaly inspection. The advancement of deep learning has significantly propelled the digitization and intelligence process of visual inspection. Nonetheless, the current learning paradigm still heavily relies on a large quantity of high-quality training samples, and exhibits limited capability in detecting anomaly categories beyond the training set (also known as open-set detection). Aiming at these challenges and inspired by the model-driven digital inspection idea, this article advocates for the thorough exploration of the auxiliary potential of 3D models in visual inspection. Diverging from the traditional paradigm, which mainly leverages digital models as data management centers, this article explicitly highlights two additional critical functions of 3D models: knowledge carriers and detection references. The efficacy of the proposed approach is demonstrated through case studies.

源语言英语
主期刊名Third International Conference on Advanced Manufacturing Technology and Manufacturing Systems, ICAMTMS 2024
编辑Ke Zhang, Dailin Zhang
出版商SPIE
ISBN(电子版)9781510681804
DOI
出版状态已出版 - 2024
活动3rd International Conference on Advanced Manufacturing Technology and Manufacturing Systems, ICAMTMS 2024 - Changsha, 中国
期限: 24 5月 2024 → 26 5月 2024

丛书

姓名Proceedings of SPIE - The International Society for Optical Engineering
卷13226
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议3rd International Conference on Advanced Manufacturing Technology and Manufacturing Systems, ICAMTMS 2024
国家/地区中国
市Changsha
时期24/05/24 → 26/05/24

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