TY - JOUR
T1 - Applicability study on fault diagnostic methods for analog electronic systems
AU - Guo, Rongbin
AU - Zhang, Shunong
AU - Gao, Peng
AU - Liu, Jiaming
N1 - Publisher Copyright:
© Springer International Publishing Switzerland 2015.
PY - 2015
Y1 - 2015
N2 - In this article, a comprehensive investigation to the current fault diagnostic methods for analog circuits is conducted. The ideas of these methods are described. Some key capabilities of these methods for analog circuits are taken into account, which include the capabilities of detection, location and identification, the capabilities of detecting single fault or multiple faults and soft faults or hard faults, the capabilities of diagnosing linear circuits or nonlinear circuits, etc. Then, what kinds of methods are applied to the built-in test (BIT) for electronic systems is investigated. At last, summary and future work on the research are presented.
AB - In this article, a comprehensive investigation to the current fault diagnostic methods for analog circuits is conducted. The ideas of these methods are described. Some key capabilities of these methods for analog circuits are taken into account, which include the capabilities of detection, location and identification, the capabilities of detecting single fault or multiple faults and soft faults or hard faults, the capabilities of diagnosing linear circuits or nonlinear circuits, etc. Then, what kinds of methods are applied to the built-in test (BIT) for electronic systems is investigated. At last, summary and future work on the research are presented.
UR - https://www.scopus.com/pages/publications/84951041356
U2 - 10.1007/978-3-319-09507-3_104
DO - 10.1007/978-3-319-09507-3_104
M3 - 文章
AN - SCOPUS:84951041356
SN - 2195-4356
VL - 19
SP - 1233
EP - 1246
JO - Lecture Notes in Mechanical Engineering
JF - Lecture Notes in Mechanical Engineering
ER -