TY - GEN
T1 - Applicability study of Steinberg vibration fatigue model in electronic products
AU - Chen, Ying
AU - Yang, Liu
AU - Liu, Bingdong
AU - Xue, Dan
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2014/12/16
Y1 - 2014/12/16
N2 - In the vibration environment, electronic products may have fatigue failure, which affects its reliability level seriously. Therefore, it is important to estimate the vibration fatigue life of electronic products. The common used vibration fatigue model is Steinberg model which is necessary to be studied. This paper analyzes the derivation of Steinberg vibration fatigue model. Assumptions and simplifications of the model and the influence of parameters on the vibration fatigue life are studied. Finally, the applicability of the model and vibration design guidelines of electronic products are summarized. It provides a basis for the improvement of vibration design.
AB - In the vibration environment, electronic products may have fatigue failure, which affects its reliability level seriously. Therefore, it is important to estimate the vibration fatigue life of electronic products. The common used vibration fatigue model is Steinberg model which is necessary to be studied. This paper analyzes the derivation of Steinberg vibration fatigue model. Assumptions and simplifications of the model and the influence of parameters on the vibration fatigue life are studied. Finally, the applicability of the model and vibration design guidelines of electronic products are summarized. It provides a basis for the improvement of vibration design.
KW - Steinberg vibration fatigue model
KW - applicability
KW - design guidelines for vibration
UR - https://www.scopus.com/pages/publications/84943192566
U2 - 10.1109/PHM.2014.6988127
DO - 10.1109/PHM.2014.6988127
M3 - 会议稿件
AN - SCOPUS:84943192566
T3 - Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014
SP - 31
EP - 35
BT - Proceedings of 2014 Prognostics and System Health Management Conference, PHM 2014
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2014 Prognostics and System Health Management Conference, PHM 2014
Y2 - 24 August 2014 through 27 August 2014
ER -