摘要
Antiferromagnetic imaging is critical for understanding and optimizing the properties of antiferromagnetic materials and devices. Despite the widespread use of high-energy electrons for atomic-scale imaging, they have low sensitivity to spin textures. Typically, the magnetic contribution to the phase of a high-energy electron wave is weaker than one percent of the electrostatic potential. Here, we demonstrate direct imaging of antiferromagnetic lattice through precise phase retrieval via electron ptychography, paving the way for magnetic lattice imaging of antiferromagnetic materials and devices.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 466-472 |
| 页数 | 7 |
| 期刊 | Science Bulletin |
| 卷 | 69 |
| 期 | 4 |
| DOI | |
| 出版状态 | 已出版 - 26 2月 2024 |
| 已对外发布 | 是 |
指纹
探究 'Antiferromagnetic imaging via ptychographic phase retrieval' 的科研主题。它们共同构成独一无二的指纹。引用此
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