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Analysis of influence factors of Faraday rotation measurement by magneto-optic modulation

  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

The ultrasensitive measurement of Faraday rotation finds application in many scientific and technological applications. Various polarimetry techniques are used to measure such rotation. The measurement of Faraday rotation based on magneto-optic modulation is most commonly used owing to its effectiveness at low-frequency range. Phenomenologically Faraday rotation in a magneto-optical glass depends upon the characteristics parameter Verdet constant, interaction length and applied axial magnetic field. In this paper, the influence of various factors on the precise measurement of Faraday rotation in magneto-optical glass has been theoretically analyzed and investigated by simulation and experiments. The theoretical analysis shows that the precision of measurement of Faraday rotation is affected by the various factors associated with experimental modalities. The factors namely cross polarization angle, modulation depth, homogeneity of the magnetic field, and extinction ratio of the polarizers have been analyzed. The results show that there is a characteristics impact of systematic variation of the relative polarizer and analyzer orientation. The precision of measurement is influenced by modulation depth and homogeneity of applied magnetic field. The optimum cross polarization angle is dependent on the extinction ratio of polarizers used. Based on the analysis a framework has been proposed to improve the precision of Faraday measurements.

源语言英语
主期刊名2017 International Conference on Optical Instruments and Technology
主期刊副标题Optoelectronic Measurement Technology and Systems
编辑Kexin Xu, Hai Xiao, Jigui Zhu, Hwa-Yaw Tam
出版商SPIE
ISBN(电子版)9781510617537
DOI
出版状态已出版 - 2018
活动2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Beijing, 中国
期限: 28 10月 201730 10月 2017

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
10621
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
国家/地区中国
Beijing
时期28/10/1730/10/17

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