@inproceedings{dde0e62454e84a5d89debc9e25a5e5c9,
title = "Analysis and Testing of Conducted Electromagnetic Susceptibility in Integrated Circuits Based on Multi-Waveform Interference Using BCI",
abstract = "This paper integrates a Bulk Current Injection (BCI) probe with various types of interference signals to design a multi-waveform interference-based BCI conducted electromagnetic susceptibility (EMS) test for integrated circuits. This paper analyzes the impact of different types of interference signals on the susceptibility of integrated circuits according to the results of conducted electromagnetic susceptibility testing.",
keywords = "Bulk Current Injection, conducted electromagnetic susceptibility, integrated circuits styling, interference signals, multi-waveform",
author = "Changshun Fu and Zhaowen Yan and Fuyu Zhao and Kunkun Hu and Ying Chen and Siyi Xing",
note = "Publisher Copyright: {\textcopyright} 2024 IEEE.; 10th IEEE International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, MAPE 2024 ; Conference date: 27-11-2024 Through 30-11-2024",
year = "2024",
doi = "10.1109/MAPE62875.2024.10813969",
language = "英语",
series = "2024 IEEE 10th International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, MAPE 2024",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2024 IEEE 10th International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, MAPE 2024",
address = "美国",
}