TY - GEN
T1 - An evaluation method for reconstructed images in electrical tomography
AU - Wang, Chao
AU - Qian, Xiangchen
AU - Yan, Yong
AU - Dong, Feng
AU - Wang, Huaxiang
PY - 2008
Y1 - 2008
N2 - The quality of reconstructed images plays an important part in evaluating reconstruction algorithms in electrical tomography. Existing image evaluation methods have many limitations. A multi-parameter and quantitative evaluation method is presented in this paper, which is based on the analysis of the characteristics of reconstructed images and digital image processing methods. The new method has three types of evaluation parameters, i.e., area, position, and similarity parameters. In order to ensure the efficacy of the new method, some typical distribution models are built using electrical field simulation software. Simulation data derived from the finite element method are also given. The simulation data demonstrate that the method is suitable for comprehensive evaluation of reconstructed images and the results are consistent with visual perception.
AB - The quality of reconstructed images plays an important part in evaluating reconstruction algorithms in electrical tomography. Existing image evaluation methods have many limitations. A multi-parameter and quantitative evaluation method is presented in this paper, which is based on the analysis of the characteristics of reconstructed images and digital image processing methods. The new method has three types of evaluation parameters, i.e., area, position, and similarity parameters. In order to ensure the efficacy of the new method, some typical distribution models are built using electrical field simulation software. Simulation data derived from the finite element method are also given. The simulation data demonstrate that the method is suitable for comprehensive evaluation of reconstructed images and the results are consistent with visual perception.
KW - Digital image processing
KW - Electrical tomography
KW - Evaluation method
KW - Image reconstruction
UR - https://www.scopus.com/pages/publications/51349128576
U2 - 10.1109/IMTC.2008.4547125
DO - 10.1109/IMTC.2008.4547125
M3 - 会议稿件
AN - SCOPUS:51349128576
SN - 1424415411
SN - 9781424415410
T3 - Conference Record - IEEE Instrumentation and Measurement Technology Conference
SP - 692
EP - 696
BT - 2008 IEEE International Instrumentation and Measurement Technology Conference Proceedings, I2MTC
T2 - 2008 IEEE International Instrumentation and Measurement Technology Conference, I2MTC
Y2 - 12 May 2008 through 15 May 2008
ER -