TY - GEN
T1 - An automatic testing framework for embedded software
AU - Shuaishuai, Yang
AU - Zhengwei, Yu
AU - Bin, Liu
AU - Yunfeng, Lu
AU - Zhijie, Gao
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/10/26
Y1 - 2017/10/26
N2 - With the widespread use of embedded software, the embedded software testing has become an indispensable part of the development process. The current representative tools for testing embedded software include ADS2 made by TechSAT, RT-LAB developed by OpalRT, and GESTE developed by Beihang University. However, their degree of automation is inadequate. Therefore, this paper studies an automatic testing framework for embedded software. It through Interface Protocol Modeling Module, Test Profile Modeling Module, Test Data Generation Module and T est Script Generation Module, to achieve platform-related test script generation. The framework greatly reduces the time for testers to design test cases.
AB - With the widespread use of embedded software, the embedded software testing has become an indispensable part of the development process. The current representative tools for testing embedded software include ADS2 made by TechSAT, RT-LAB developed by OpalRT, and GESTE developed by Beihang University. However, their degree of automation is inadequate. Therefore, this paper studies an automatic testing framework for embedded software. It through Interface Protocol Modeling Module, Test Profile Modeling Module, Test Data Generation Module and T est Script Generation Module, to achieve platform-related test script generation. The framework greatly reduces the time for testers to design test cases.
KW - Automatic
KW - Embedded
KW - Framework
KW - Software Testing
UR - https://www.scopus.com/pages/publications/85040127510
U2 - 10.1109/ICCSE.2017.8085501
DO - 10.1109/ICCSE.2017.8085501
M3 - 会议稿件
AN - SCOPUS:85040127510
T3 - ICCSE 2017 - 12th International Conference on Computer Science and Education
SP - 269
EP - 274
BT - ICCSE 2017 - 12th International Conference on Computer Science and Education
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 12th International Conference on Computer Science and Education, ICCSE 2017
Y2 - 22 August 2017 through 25 August 2017
ER -