摘要
This paper presents an automatic gain calibration system for ion-sensitive field effect transistors (ISFETs) sensing arrays which compensates for mismatch in the gain of the pixels. The system utilizes the high frequency spectrum of the sensed signal to superimpose a reference sine wave through the reference electrode, which allows identification and calibration of the local gain. The complete system has been fabricated in a 0.35 μm CMOS process and has been designed to achieve very high accuracy and a small settling time to allow fast pixel switching. Measured results confirm good performance with only a 1.15% deviation in gain caused by noise and harmonic distortion and a rapid settling time of 70.5 μs which is suitable for CMOS-based ISFET arrays.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 1511-1520 |
| 页数 | 10 |
| 期刊 | IEEE Transactions on Circuits and Systems |
| 卷 | 63 |
| 期 | 9 |
| DOI | |
| 出版状态 | 已出版 - 9月 2016 |
| 已对外发布 | 是 |
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