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An automatic design technique for hardware system of ATS

  • Baojiang Sun*
  • , Honglei Qin
  • , Shituan Shen
  • *此作品的通讯作者
  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

The hardware development of Automatic Test System (ATS) is the design foundation of system. Traditionally, hardware design is a manual effort, and then based on it, the ATS software is developed. The disadvantages of manual design are obvious: heavy workload, depending on the experience of developers, limiting the quality, efficiency and standardization of hardware design, and being difficult in design data updating. As a result, the performance of the whole test system is affected. Focusing research on ATS design flows, this paper presents an automatic design technique for hardware system of ATS. During the design process, the only need is to input test points information of Unit Under Test (UUT) and test requirements based on UUT model, and then the development platform will use several new design techniques such as automatic matching between instrument ports and UUT test points, general purpose ports design, automatic switch network generation, ITA auto-routing, and ATS self-test adapter design and so on to finish automatically a series of ATS hardware design works, which are hardware configuration, ITA design, system self-test adapter design, and fabrication drawing generation of ITA, self-test adapter and cables, etc. Developer can also choose the design solution that best fits the need from alternatives provided by development platform. This technique can significantly decrease design to factory implementation time and cost, and increase the degree of standardization and generalization of ATS.

源语言英语
主期刊名2006 IEEE AUTOTESTCON - IEEE Systems Readiness Technology Conference, Proceedings
出版商Institute of Electrical and Electronics Engineers Inc.
386-396
页数11
ISBN(印刷版)142440052X, 9781424400522
DOI
出版状态已出版 - 2006
活动2006 IEEE AUTOTESTCON - IEEE Systems Readiness Technology Conference - Anaheim, CA, 美国
期限: 18 9月 200621 9月 2006

出版系列

姓名AUTOTESTCON (Proceedings)

会议

会议2006 IEEE AUTOTESTCON - IEEE Systems Readiness Technology Conference
国家/地区美国
Anaheim, CA
时期18/09/0621/09/06

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