TY - GEN
T1 - An Approach for Process FMEA Based on Blackboard Structure and Semantics
AU - Chen, Jize
AU - Yang, De Zhen
AU - Xie, Yun
AU - Lin, Lei
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/8
Y1 - 2019/8
N2 - Nowadays, the mainstream researches of FMEA (Failure Mode Effect Analysis) are mostly about products, the few process FMEA researches often ignore the influences of single process failure on the whole manufacture process, or are just failure modes arranging without considering the further influence of process failure. So, in this article, we firstly build a process mode and process failure mode knowledge database using ontology in order to deal with the complicated production process knowledge. Secondly, we build a blackboard structure, which can use our ontology database and semantics to execute process FMEA automatically. Being exemplified by the analysis of a aircraft skin, the present study demonstrates that all approaches are feasible, efficient, and could be applied in real engineering scenarios.
AB - Nowadays, the mainstream researches of FMEA (Failure Mode Effect Analysis) are mostly about products, the few process FMEA researches often ignore the influences of single process failure on the whole manufacture process, or are just failure modes arranging without considering the further influence of process failure. So, in this article, we firstly build a process mode and process failure mode knowledge database using ontology in order to deal with the complicated production process knowledge. Secondly, we build a blackboard structure, which can use our ontology database and semantics to execute process FMEA automatically. Being exemplified by the analysis of a aircraft skin, the present study demonstrates that all approaches are feasible, efficient, and could be applied in real engineering scenarios.
KW - FMEA
KW - blackboard structure
KW - ontology
KW - process failure
UR - https://www.scopus.com/pages/publications/85082396405
U2 - 10.1109/QR2MSE46217.2019.9021150
DO - 10.1109/QR2MSE46217.2019.9021150
M3 - 会议稿件
AN - SCOPUS:85082396405
T3 - Proceedings of 2019 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, QR2MSE 2019
SP - 755
EP - 760
BT - Proceedings of 2019 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, QR2MSE 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2019 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, QR2MSE 2019
Y2 - 6 August 2019 through 9 August 2019
ER -