An active register control strategy for multilayer R2R printed electronics based on microscope vision

Lele Hu; Weihai Chen; Wenjie Chen; Zhong Liu

doi:10.1109/ICIEA.2018.8398148

An active register control strategy for multilayer R2R printed electronics based on microscope vision

Lele Hu
, Weihai Chen^*
, Wenjie Chen
, Zhong Liu

^*此作品的通讯作者

自动化科学与电气工程学院

Beihang University
Agency for Science, Technology and Research, Singapore

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

2 引用（Scopus）

摘要

Multilayer alignment is the decisive factor that influences performance of printed electronics in R2R process. This paper presents an active register control strategy to achieve high-precision registration between layers. A high resolution microscope camera is used to measure registration error in proposed strategy. Due to the small view field of the microscope camera, it's difficult to calibrate this camera by conventional methods. Therefore, a motion-based calibration method which utilizes relative micromovement of print header is proposed firstly. This register control strategy fine-tunes the trajectory of nozzle in XOY plane by five degree of freedom compliant alignment stage. The calibration method and designed control strategy are verified in experiment and results indicate that the microscope camera is calibrated accurately and high resolution registration is ultimately realized.

源语言	英语
主期刊名	Proceedings of the 13th IEEE Conference on Industrial Electronics and Applications, ICIEA 2018
出版商	Institute of Electrical and Electronics Engineers Inc.
页	2590-2595
页数	6
ISBN（电子版）	9781538637579
DOI	https://doi.org/10.1109/ICIEA.2018.8398148
出版状态	已出版 - 26 6月 2018
活动	13th IEEE Conference on Industrial Electronics and Applications, ICIEA 2018 - Wuhan, 中国期限: 31 5月 2018 → 2 6月 2018

丛书

姓名	Proceedings of the 13th IEEE Conference on Industrial Electronics and Applications, ICIEA 2018

会议

会议	13th IEEE Conference on Industrial Electronics and Applications, ICIEA 2018
国家/地区	中国
市	Wuhan
时期	31/05/18 → 2/06/18

联合国可持续发展目标

此成果有助于实现下列可持续发展目标：

可持续发展目标 7 经济适用的清洁能源

访问文件

10.1109/ICIEA.2018.8398148

其它文件与链接

链接到 Scopus 的出版物

引用此

Hu, L., Chen, W., Chen, W., & Liu, Z. (2018). An active register control strategy for multilayer R2R printed electronics based on microscope vision. 在 Proceedings of the 13th IEEE Conference on Industrial Electronics and Applications, ICIEA 2018 (页码 2590-2595). (Proceedings of the 13th IEEE Conference on Industrial Electronics and Applications, ICIEA 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICIEA.2018.8398148

Hu, Lele ; Chen, Weihai ; Chen, Wenjie 等. / An active register control strategy for multilayer R2R printed electronics based on microscope vision. Proceedings of the 13th IEEE Conference on Industrial Electronics and Applications, ICIEA 2018. Institute of Electrical and Electronics Engineers Inc., 2018. 页码 2590-2595 (Proceedings of the 13th IEEE Conference on Industrial Electronics and Applications, ICIEA 2018).

@inproceedings{e87ef66c5a92427fb4a240de2270d60a,

title = "An active register control strategy for multilayer R2R printed electronics based on microscope vision",

abstract = "Multilayer alignment is the decisive factor that influences performance of printed electronics in R2R process. This paper presents an active register control strategy to achieve high-precision registration between layers. A high resolution microscope camera is used to measure registration error in proposed strategy. Due to the small view field of the microscope camera, it's difficult to calibrate this camera by conventional methods. Therefore, a motion-based calibration method which utilizes relative micromovement of print header is proposed firstly. This register control strategy fine-tunes the trajectory of nozzle in XOY plane by five degree of freedom compliant alignment stage. The calibration method and designed control strategy are verified in experiment and results indicate that the microscope camera is calibrated accurately and high resolution registration is ultimately realized.",

keywords = "microscope vision, printed electronics, register control, roll to roll",

author = "Lele Hu and Weihai Chen and Wenjie Chen and Zhong Liu",

note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 13th IEEE Conference on Industrial Electronics and Applications, ICIEA 2018 ; Conference date: 31-05-2018 Through 02-06-2018",

year = "2018",

month = jun,

day = "26",

doi = "10.1109/ICIEA.2018.8398148",

language = "英语",

series = "Proceedings of the 13th IEEE Conference on Industrial Electronics and Applications, ICIEA 2018",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "2590--2595",

booktitle = "Proceedings of the 13th IEEE Conference on Industrial Electronics and Applications, ICIEA 2018",

address = "美国",

}

Hu, L, Chen, W, Chen, W & Liu, Z 2018, An active register control strategy for multilayer R2R printed electronics based on microscope vision. 在 Proceedings of the 13th IEEE Conference on Industrial Electronics and Applications, ICIEA 2018. Proceedings of the 13th IEEE Conference on Industrial Electronics and Applications, ICIEA 2018, Institute of Electrical and Electronics Engineers Inc., 页码 2590-2595, 13th IEEE Conference on Industrial Electronics and Applications, ICIEA 2018, Wuhan, 中国, 31/05/18. https://doi.org/10.1109/ICIEA.2018.8398148

An active register control strategy for multilayer R2R printed electronics based on microscope vision. / Hu, Lele; Chen, Weihai; Chen, Wenjie 等.
Proceedings of the 13th IEEE Conference on Industrial Electronics and Applications, ICIEA 2018. Institute of Electrical and Electronics Engineers Inc., 2018. 页码 2590-2595 (Proceedings of the 13th IEEE Conference on Industrial Electronics and Applications, ICIEA 2018).

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

TY - GEN

T1 - An active register control strategy for multilayer R2R printed electronics based on microscope vision

AU - Hu, Lele

AU - Chen, Weihai

AU - Chen, Wenjie

AU - Liu, Zhong

PY - 2018/6/26

Y1 - 2018/6/26

N2 - Multilayer alignment is the decisive factor that influences performance of printed electronics in R2R process. This paper presents an active register control strategy to achieve high-precision registration between layers. A high resolution microscope camera is used to measure registration error in proposed strategy. Due to the small view field of the microscope camera, it's difficult to calibrate this camera by conventional methods. Therefore, a motion-based calibration method which utilizes relative micromovement of print header is proposed firstly. This register control strategy fine-tunes the trajectory of nozzle in XOY plane by five degree of freedom compliant alignment stage. The calibration method and designed control strategy are verified in experiment and results indicate that the microscope camera is calibrated accurately and high resolution registration is ultimately realized.

AB - Multilayer alignment is the decisive factor that influences performance of printed electronics in R2R process. This paper presents an active register control strategy to achieve high-precision registration between layers. A high resolution microscope camera is used to measure registration error in proposed strategy. Due to the small view field of the microscope camera, it's difficult to calibrate this camera by conventional methods. Therefore, a motion-based calibration method which utilizes relative micromovement of print header is proposed firstly. This register control strategy fine-tunes the trajectory of nozzle in XOY plane by five degree of freedom compliant alignment stage. The calibration method and designed control strategy are verified in experiment and results indicate that the microscope camera is calibrated accurately and high resolution registration is ultimately realized.

KW - microscope vision

KW - printed electronics

KW - register control

KW - roll to roll

UR - https://www.scopus.com/pages/publications/85050097823

U2 - 10.1109/ICIEA.2018.8398148

DO - 10.1109/ICIEA.2018.8398148

M3 - 会议稿件

AN - SCOPUS:85050097823

T3 - Proceedings of the 13th IEEE Conference on Industrial Electronics and Applications, ICIEA 2018

SP - 2590

EP - 2595

BT - Proceedings of the 13th IEEE Conference on Industrial Electronics and Applications, ICIEA 2018

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 13th IEEE Conference on Industrial Electronics and Applications, ICIEA 2018

Y2 - 31 May 2018 through 2 June 2018

ER -

Hu L, Chen W, Chen W, Liu Z. An active register control strategy for multilayer R2R printed electronics based on microscope vision. 在 Proceedings of the 13th IEEE Conference on Industrial Electronics and Applications, ICIEA 2018. Institute of Electrical and Electronics Engineers Inc. 2018. 页码 2590-2595. (Proceedings of the 13th IEEE Conference on Industrial Electronics and Applications, ICIEA 2018). doi: 10.1109/ICIEA.2018.8398148

An active register control strategy for multilayer R2R printed electronics based on microscope vision

摘要

丛书

会议

联合国可持续发展目标

访问文件

其它文件与链接

学术指纹

引用此