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Ab initio study on hexagonal Ge2Sb2Te5- A phase-change material for nonvolatile memories

  • Xiamen University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

On the basis of ab initio total energy calculations, we have performed an extensive study on the stacking sequence and random occupation of Ge and Sb to make the same layer in stable hexagonal Ge2Sb2Te 5 (h-GST), an excellent candidate for phase change random memory applications. The results demonstrate that the atomic arrangements have great effects on lattice parameter c and electronic properties of h-GST. h-GST changes from semiconductor to metallic behavior as varying the atomic sequence.

源语言英语
主期刊名Functional and Electronic Materials
出版商Trans Tech Publications Ltd
7-11
页数5
ISBN(印刷版)9783037851692
DOI
出版状态已出版 - 2011
已对外发布

出版系列

姓名Materials Science Forum
687
ISSN(印刷版)0255-5476
ISSN(电子版)1662-9752

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