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A YOLO-based defect detection system for printed circuit boards

  • Shijie Li
  • , Rui Wang*
  • , Yonghong Wang
  • *此作品的通讯作者
  • Beihang University
  • Hefei University of Technology

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

An improved YOLOv5 for PCB defect detection named as YOLO-PDD is proposed in this paper. Based on this, a circuit board defect detection system which can achieve high accuracy and fast detection of small target defects under complex background noise interference is designed. The industrial cameras and LED light sources are used in the system to capture images of circuit board defects, forming a self-made original dataset. At the same time, stitching technology is adopted to enhance the original dataset. YOLO-PDD has made the following improvements to the original YOLOv5 algorithm: Firstly, a double-layer routing attention module BRA is introduced in the feature extraction network. Next, the backbone of YOLOv5 algorithm is replaced by DenseNet. Finally, a feature pyramid network which is bidirectional and weighted in nature called Bifpn is added to the YOLOv5 feature fusion network. The circuit board defect detection system software is built based on QT and can obtain real-time detection results and data statistics online. Experimental results show that the system can accurately detect defect targets in circuit board images at a speed of 47ms per image, achieving 92.28% mAP on our self-made dataset, which is superior to the average detection accuracy of current state-of-art original detection algorithms and has good practicality and effectiveness.

源语言英语
主期刊名Ninth International Symposium on Advances in Electrical, Electronics, and Computer Engineering, ISAEECE 2024
编辑Pierluigi Siano, Wenbing Zhao
出版商SPIE
ISBN(电子版)9781510683303
DOI
出版状态已出版 - 2024
活动9th International Symposium on Advances in Electrical, Electronics, and Computer Engineering, ISAEECE 2024 - Changchun, 中国
期限: 15 3月 202417 3月 2024

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
13291
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议9th International Symposium on Advances in Electrical, Electronics, and Computer Engineering, ISAEECE 2024
国家/地区中国
Changchun
时期15/03/2417/03/24

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