TY - JOUR
T1 - A Wiener process model for accelerated degradation analysis considering measurement errors
AU - Li, Junxing
AU - Wang, Zhihua
AU - Liu, Xia
AU - Zhang, Yongbo
AU - Fu, Huimin
AU - Liu, Chengrui
N1 - Publisher Copyright:
© 2016 Elsevier Ltd
PY - 2016/10/1
Y1 - 2016/10/1
N2 - Accelerated degradation analysis plays an important role in assessing reliability and making maintenance schedule for highly reliable products with long lifetime. In practical engineering, degradation data, especially measured under accelerated condition, are often compounded and contaminated by measurement errors, which makes the analysis more challenging. Therefore, a Wiener process model simultaneously incorporating temporal variability, individual variation and measurement errors is proposed to analyze the accelerated degradation test (ADT). The explicit forms of the probability distribution function (PDF) and the cumulative distribution function (CDF) are derived based on the concept of first hitting time (FHT). Then, combining with the acceleration models, the maximum likelihood estimations (MLE) of the model parameters are obtained. Finally, a comprehensive simulation study involving two examples and a practical application are given to demonstrate the necessity and efficiency of the proposed model.
AB - Accelerated degradation analysis plays an important role in assessing reliability and making maintenance schedule for highly reliable products with long lifetime. In practical engineering, degradation data, especially measured under accelerated condition, are often compounded and contaminated by measurement errors, which makes the analysis more challenging. Therefore, a Wiener process model simultaneously incorporating temporal variability, individual variation and measurement errors is proposed to analyze the accelerated degradation test (ADT). The explicit forms of the probability distribution function (PDF) and the cumulative distribution function (CDF) are derived based on the concept of first hitting time (FHT). Then, combining with the acceleration models, the maximum likelihood estimations (MLE) of the model parameters are obtained. Finally, a comprehensive simulation study involving two examples and a practical application are given to demonstrate the necessity and efficiency of the proposed model.
KW - Accelerated degradation analysis
KW - First hitting time
KW - Measurement errors
KW - Reliability assessment
KW - Wiener process
UR - https://www.scopus.com/pages/publications/84992533272
U2 - 10.1016/j.microrel.2016.08.004
DO - 10.1016/j.microrel.2016.08.004
M3 - 文章
AN - SCOPUS:84992533272
SN - 0026-2714
VL - 65
SP - 8
EP - 15
JO - Microelectronics Reliability
JF - Microelectronics Reliability
ER -