A systematic approach for reliability assessment of electrolytic capacitor-free LED drivers

Bo Sun; Xuejun Fan; Willem Van Driel; Guoqi Zhang

doi:10.1109/EuroSimE.2016.7463387

A systematic approach for reliability assessment of electrolytic capacitor-free LED drivers

Bo Sun
, Xuejun Fan
, Willem Van Driel
, Guoqi Zhang

Delft University of Technology
State Key Laboratory of Solid-State Lighting
Lamar University
Koninklijke Philips N.V.

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

2 引用（Scopus）

摘要

In this paper, a systematic approach for reliability assessment of electrolytic capacitor-free LED drivers is developed to investigate the failure rate of MOSFETs in the drivers. An original fly-back driver with electrolytic capacitor and two modified electrolytic capacitor-free drivers are studied, and their performances are compared. Due to LED lumen depreciation during operation, current of the MOSFET decreases over time, which cancels out the effect of junction temperature increase. As a result, the junction temperature of MOSFET increase mildly for the case study, but failure rate is accelerated.

源语言	英语
主期刊名	2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016
出版商	Institute of Electrical and Electronics Engineers Inc.
ISBN（电子版）	9781509021062
DOI	https://doi.org/10.1109/EuroSimE.2016.7463387
出版状态	已出版 - 29 4月 2016
已对外发布	是
活动	17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016 - Montpellier, 法国期限: 18 4月 2016 → 20 4月 2016

丛书

姓名	2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016

会议

会议	17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016
国家/地区	法国
市	Montpellier
时期	18/04/16 → 20/04/16

访问文件

10.1109/EuroSimE.2016.7463387

其它文件与链接

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引用此

Sun, B., Fan, X., Van Driel, W., & Zhang, G. (2016). A systematic approach for reliability assessment of electrolytic capacitor-free LED drivers. 在 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016 期刊论文 7463387 (2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EuroSimE.2016.7463387

Sun, Bo ; Fan, Xuejun ; Van Driel, Willem 等. / A systematic approach for reliability assessment of electrolytic capacitor-free LED drivers. 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016. Institute of Electrical and Electronics Engineers Inc., 2016. (2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016).

@inproceedings{b355a48aec4a495c84f7885f83f4ad70,

title = "A systematic approach for reliability assessment of electrolytic capacitor-free LED drivers",

abstract = "In this paper, a systematic approach for reliability assessment of electrolytic capacitor-free LED drivers is developed to investigate the failure rate of MOSFETs in the drivers. An original fly-back driver with electrolytic capacitor and two modified electrolytic capacitor-free drivers are studied, and their performances are compared. Due to LED lumen depreciation during operation, current of the MOSFET decreases over time, which cancels out the effect of junction temperature increase. As a result, the junction temperature of MOSFET increase mildly for the case study, but failure rate is accelerated.",

keywords = "Electrolytic Capacitor-Free LED Driver, MOSFET, Reliability",

author = "Bo Sun and Xuejun Fan and \{Van Driel\}, Willem and Guoqi Zhang",

note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016 ; Conference date: 18-04-2016 Through 20-04-2016",

year = "2016",

month = apr,

day = "29",

doi = "10.1109/EuroSimE.2016.7463387",

language = "英语",

series = "2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016",

address = "美国",

}

Sun, B, Fan, X, Van Driel, W & Zhang, G 2016, A systematic approach for reliability assessment of electrolytic capacitor-free LED drivers. 在 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016., 7463387, 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016, Institute of Electrical and Electronics Engineers Inc., 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016, Montpellier, 法国, 18/04/16. https://doi.org/10.1109/EuroSimE.2016.7463387

A systematic approach for reliability assessment of electrolytic capacitor-free LED drivers. / Sun, Bo; Fan, Xuejun; Van Driel, Willem 等.
2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016. Institute of Electrical and Electronics Engineers Inc., 2016. 7463387 (2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016).

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

TY - GEN

T1 - A systematic approach for reliability assessment of electrolytic capacitor-free LED drivers

AU - Sun, Bo

AU - Fan, Xuejun

AU - Van Driel, Willem

AU - Zhang, Guoqi

PY - 2016/4/29

Y1 - 2016/4/29

N2 - In this paper, a systematic approach for reliability assessment of electrolytic capacitor-free LED drivers is developed to investigate the failure rate of MOSFETs in the drivers. An original fly-back driver with electrolytic capacitor and two modified electrolytic capacitor-free drivers are studied, and their performances are compared. Due to LED lumen depreciation during operation, current of the MOSFET decreases over time, which cancels out the effect of junction temperature increase. As a result, the junction temperature of MOSFET increase mildly for the case study, but failure rate is accelerated.

AB - In this paper, a systematic approach for reliability assessment of electrolytic capacitor-free LED drivers is developed to investigate the failure rate of MOSFETs in the drivers. An original fly-back driver with electrolytic capacitor and two modified electrolytic capacitor-free drivers are studied, and their performances are compared. Due to LED lumen depreciation during operation, current of the MOSFET decreases over time, which cancels out the effect of junction temperature increase. As a result, the junction temperature of MOSFET increase mildly for the case study, but failure rate is accelerated.

KW - Electrolytic Capacitor-Free LED Driver

KW - MOSFET

KW - Reliability

UR - https://www.scopus.com/pages/publications/84974625058

U2 - 10.1109/EuroSimE.2016.7463387

DO - 10.1109/EuroSimE.2016.7463387

M3 - 会议稿件

AN - SCOPUS:84974625058

T3 - 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016

BT - 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016

Y2 - 18 April 2016 through 20 April 2016

ER -

Sun B, Fan X, Van Driel W, Zhang G. A systematic approach for reliability assessment of electrolytic capacitor-free LED drivers. 在 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016. Institute of Electrical and Electronics Engineers Inc. 2016. 7463387. (2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016). doi: 10.1109/EuroSimE.2016.7463387

A systematic approach for reliability assessment of electrolytic capacitor-free LED drivers

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