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A study on the impact of pre-trained model on Just-In-Time defect prediction

  • Beihang University
  • CAS - Institute of Software
  • City University of Hong Kong

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Previous researchers conducting Just-In-Time (JIT) defect prediction tasks have primarily focused on the performance of individual pre-trained models, without exploring the relationship between different pre-trained models as backbones. In this study, we build six models: RoBERTaJIT, CodeBERTJIT, BARTJIT, PLBARTJIT, GPT2JIT, and CodeGPTJIT, each with a distinct pre-trained model as its backbone. We systematically explore the differences and connections between these models. Specifically, we investigate the performance of the models when using Commit code and Commit message as inputs, as well as the relationship between training efficiency and model distribution among these six models. Additionally, we conduct an ablation experiment to explore the sensitivity of each model to inputs. Furthermore, we investigate how the models perform in zero-shot and few-shot scenarios. Our findings indicate that each model based on different backbones shows improvements, and when the backbone's pre-training model is similar, the training resources that need to be consumed are closer. We also observe that Commit code plays a significant role in defect detection, and different pre-trained models demonstrate better defect detection ability with a balanced dataset under few-shot scenarios. These results provide new insights for optimizing JIT defect prediction tasks using pre-trained models and highlight the factors that require more attention when constructing such models. Additionally, CodeGPTJIT and GPT2JIT achieved better performance than DeepJIT and CC2Vec on the two datasets respectively under 2000 training samples. These findings emphasize the effectiveness of transformer-based pre-trained models in JIT defect prediction tasks, especially in scenarios with limited training data.

源语言英语
主期刊名Proceedings - 2023 IEEE 23rd International Conference on Software Quality, Reliability, and Security, QRS 2023
出版商Institute of Electrical and Electronics Engineers Inc.
105-116
页数12
ISBN(电子版)9798350319583
DOI
出版状态已出版 - 2023
活动23rd IEEE International Conference on Software Quality, Reliability, and Security, QRS 2023 - Chiang Mai, 泰国
期限: 22 10月 202326 10月 2023

出版系列

姓名IEEE International Conference on Software Quality, Reliability and Security, QRS
ISSN(印刷版)2693-9177

会议

会议23rd IEEE International Conference on Software Quality, Reliability, and Security, QRS 2023
国家/地区泰国
Chiang Mai
时期22/10/2326/10/23

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