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A study on EMC stress-strength interference model and EMC reliability

  • Jian Wu*
  • , Shuguo Xie
  • , Tenglong Ke
  • , Xi Chen
  • , Can Li
  • *此作品的通讯作者
  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

This paper proposed a new concept named EMC reliability to describe the capability of electromagnetic compatibility from the perspective of probability and statistics. Based on the model of EMC stress and EMC strength, an interference model between them is established to obtain the EMC reliability. The results show that this method could not only forecast the level of electromagnetic compatibility of the system effectively, but also provide a significant reference for EMC design and optimization.

源语言英语
主期刊名2012 10th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2012
677-680
页数4
DOI
出版状态已出版 - 2012
活动2012 10th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2012 - Xi'an, 中国
期限: 22 10月 201226 10月 2012

出版系列

姓名2012 10th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2012

会议

会议2012 10th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2012
国家/地区中国
Xi'an
时期22/10/1226/10/12

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