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A statistical model to locate faults at input level

  • Ji Wu*
  • , Xiao Xia Jia
  • , Chang Liu
  • , Hai Yan Yang
  • , Chao Liu
  • , Mao Zhong Jin
  • *此作品的通讯作者
  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

We present a statistical model to locate faults at the input level based on the failure patterns and the success patterns. The model neither needs to be fed with software module, code or trace information, nor does it require re-executing the program. To evaluate the model, precision and recall are adopted as the criteria. Five programs are examined and 17 testing experiments are conducted in which the model gains 0.803 in precision and 0.697 in recall on average.

源语言英语
主期刊名Proceedings - 19th International Conference on Automated Software Engineering, ASE 2004
274-277
页数4
出版状态已出版 - 2004
活动Proceedings - 19th International Conference on Automated Software Engineering, ASE 2004 - Linz, 奥地利
期限: 20 9月 200424 9月 2004

出版系列

姓名Proceedings - 19th International Conference on Automated Software Engineering, ASE 2004

会议

会议Proceedings - 19th International Conference on Automated Software Engineering, ASE 2004
国家/地区奥地利
Linz
时期20/09/0424/09/04

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