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A spectral calibration approach for snapshot Image Mapping Spectrometer (IMS)

  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

The snapshot image mapping spectrometer (IMS) is a hyper-spectral imaging system that simultaneously captures spatial and spectral information about an object in a single integral time. The spectral calibration can help to obtain accurate 3D datacube of the objects. This paper proposes a new approach to improve the spectral calibration accuracy of the instrument. By adding a slit mask into the optical path to reduce crosstalk, the accuracy of each sub pupil center and spectral channel location can be improved. The calibration process is simulated to analyze the effects of the size and position designed for the mask. The analysis results show that the calibration accuracy of each sub pupil center position and spectral channel position for IMS is 3μm, which is significantly improved than the calibration accuracy 10.5μm without the mask.

源语言英语
主期刊名9th International Symposium on Advanced Optical Manufacturing and Testing Technologies
主期刊副标题Optical Test, Measurement Technology, and Equipment
编辑Bin Fan, Fan Wu, Yudong Zhang, Xiaoliang Ma, Xiong Li
出版商SPIE
ISBN(电子版)9781510623200
DOI
出版状态已出版 - 2019
活动9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment - Chengdu, 中国
期限: 26 6月 201829 6月 2018

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
10839
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
国家/地区中国
Chengdu
时期26/06/1829/06/18

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