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A Quad-Tip Wideband E-Field Probe With High Spatial Resolution For Near-Field Measurement

  • Mahmoud Mohammed
  • , Ahmed Khodeir
  • , Zhaowen Yan
  • , Fuyu Zhao
  • , Tengfei Gao
  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Based on a quad V-shaped tip design, this paper introduces a novel high-performance, low-cost, wideband, and high spatial resolution electric field probe that operates from 10 kHz to 12 GHz for identifying and locating the EMI problem of the electric and electronic systems for near-field measurement. The sensitivity increased to -19 dB which is 8 dB higher than commercial and other introduced probes. The spatial resolution increased to 0.75 mm at 10 GHz. This probe is fabricated in a four-layer printed circuit board (PCB) with high-performance dielectric (RO4450 and RO4003) with a tip width of 4 mm which is very suitable for the narrow and complex PCBs.

源语言英语
主期刊名2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9798350341140
DOI
出版状态已出版 - 2023
活动2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023 - Kuala Lumpur, 马来西亚
期限: 30 10月 20232 11月 2023

出版系列

姓名2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023

会议

会议2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023
国家/地区马来西亚
Kuala Lumpur
时期30/10/232/11/23

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