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A Novel Subpixel Edge Detection Method of Pantograph Slide in Complicated Surroundings

  • Shengfang Lu*
  • , Zhen Liu
  • , Ye Chen
  • , Yang Gao
  • *此作品的通讯作者
  • Nanjing Institute of Technology

科研成果: 期刊稿件文章同行评审

摘要

Pantograph slide is a vulnerable component because of the contact and friction between the pantograph and catenary while the train runs with a high speed. Condition monitoring of the slide is a necessary and meaningful work to improve the operation efficiency and reduce the occurrence of accident. It is a hard work to measure the slide abrasion due to the dynamic and complicated environment. In this article, an accurate edge extraction method based on image analysis is proposed, which aims at providing an image metric property based on vision measurement to detect the wear of slide. First, a subpixel edge detection method is proposed. The gradient in horizontal direction is first taken into account, which filters out the nonhorizontal edges. Then, the upper and lower edges of the slide are located using the geometric restriction. The subpixel edge feature are also extracted in the image process, which can be used to the vision measurement system for monitoring the wear condition of the slide. The experiment results shows that the proposed algorithm can precisely detect the subpixel edges of the slide. The measurement error of the slide is less than 2 mm, which demonstrates that the proposed algorithm has a high accuracy in the large field of view.

源语言英语
页(从-至)3172-3182
页数11
期刊IEEE Transactions on Industrial Electronics
69
3
DOI
出版状态已出版 - 1 3月 2022

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