@inproceedings{8199e538d3f640ce8e9954eee8763e1f,
title = "A Novel Method for Dielectric Constants Extraction and Material Thickness Derivation",
abstract = "A novel method is proposed in this paper for extracting dielectric constants of non-magnetic materials and deriving material thickness. The extraction process is independent of thickness and does not have ambiguous value. Then the thickness derivation is conveniently based on the calculated dielectric constants. The proposed method is validated by simulation data and achieves reliable dielectric constants and material thickness value. It is verified in the waveguide measurement system and also suitable for coaxial line and free space measurement. This method is appropriate for materials whose properties are unknown or thickness cannot be exactly measured.",
keywords = "dielectric constants, scattering parameters, thickness independent",
author = "Jingxue Zhang and Zhiping Li and Yao Li and Jungang Miao",
note = "Publisher Copyright: {\textcopyright} 2022 SPIE. All rights reserved.; 7th International Symposium on Advances in Electrical, Electronics, and Computer Engineering ; Conference date: 18-03-2022 Through 20-03-2022",
year = "2022",
doi = "10.1117/12.2641175",
language = "英语",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Tao Zhang",
booktitle = "7th International Symposium on Advances in Electrical, Electronics, and Computer Engineering",
address = "美国",
}