TY - JOUR
T1 - A novel calibration approach to structured light 3D vision inspection
AU - Zhang, Guangjun
AU - Wei, Zhenzhong
PY - 2002/7
Y1 - 2002/7
N2 - Structured light 3D vision inspection is a commonly used method for various 3D surface profiling techniques. In this paper, a novel approach is proposed to generate the sufficient calibration points with high accuracy for structured light 3D vision. This approach is based on a flexible calibration target, composed of a photo-electrical aiming device and a 3D translation platform. An improved algorithm of back propagation (BP) neural network is also presented, and is successfully applied to the calibration of structured light 3D vision inspection. Finally, using the calibration points and the improved algorithm of BP neural network, the best network structure is established. The training accuracy for the best BP network structure is 0.083 mm, and its testing accuracy is 0.128 mm.
AB - Structured light 3D vision inspection is a commonly used method for various 3D surface profiling techniques. In this paper, a novel approach is proposed to generate the sufficient calibration points with high accuracy for structured light 3D vision. This approach is based on a flexible calibration target, composed of a photo-electrical aiming device and a 3D translation platform. An improved algorithm of back propagation (BP) neural network is also presented, and is successfully applied to the calibration of structured light 3D vision inspection. Finally, using the calibration points and the improved algorithm of BP neural network, the best network structure is established. The training accuracy for the best BP network structure is 0.083 mm, and its testing accuracy is 0.128 mm.
KW - 3D vision inspection
KW - Calibration point
KW - Flexible calibration target
KW - Improved BP neural network
KW - Structured light
KW - Training and testing
UR - https://www.scopus.com/pages/publications/0036647506
U2 - 10.1016/S0030-3992(02)00031-2
DO - 10.1016/S0030-3992(02)00031-2
M3 - 文章
AN - SCOPUS:0036647506
SN - 0030-3992
VL - 34
SP - 373
EP - 380
JO - Optics and Laser Technology
JF - Optics and Laser Technology
IS - 5
ER -