TY - GEN
T1 - A New Methodology to Identify the Conducted Emission Source of Integrated Circuits
AU - Li, Yuanhao
AU - Xie, Shuguo
AU - Zhao, Chenji
N1 - Publisher Copyright:
© 2021 IEEE.
PY - 2021
Y1 - 2021
N2 - In this paper, we introduce a new method for identifying internal conducted emission (CE) source of Integrated Circuits (ICs). By studying the spectrum characteristics of three typical internal interference sources, sine wave, square wave and spike, and the general characteristics of the power distribution network (PDN) transfer functions of ICs, the envelope detrending method is proposed, which combines machine learning and classification algorithms to make it possible to identify the conducted emission source of ICs.
AB - In this paper, we introduce a new method for identifying internal conducted emission (CE) source of Integrated Circuits (ICs). By studying the spectrum characteristics of three typical internal interference sources, sine wave, square wave and spike, and the general characteristics of the power distribution network (PDN) transfer functions of ICs, the envelope detrending method is proposed, which combines machine learning and classification algorithms to make it possible to identify the conducted emission source of ICs.
KW - classification algorithm
KW - conducted emission
KW - envelope detrending method
KW - Integrated Circuits
KW - power distribution network
UR - https://www.scopus.com/pages/publications/85129379187
U2 - 10.1109/ISAPE54070.2021.9753587
DO - 10.1109/ISAPE54070.2021.9753587
M3 - 会议稿件
AN - SCOPUS:85129379187
T3 - 13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021 - Proceedings
BT - 13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021
Y2 - 1 December 2021 through 4 December 2021
ER -