TY - GEN
T1 - A New Methodology to Build the ICEM-CE Model for Microcontroller Units
AU - Yuanhao, Li
AU - Shuguo, Xie
AU - Yishu, Chen
N1 - Publisher Copyright:
© 2021 IEEE.
PY - 2021
Y1 - 2021
N2 - In order to predict the conduction emission performance of a circuit board, manufacturers need to provide the electromagnetic compatibility (EMC) model of the chip to users. The Integrated circuit emission model-conducted emissions (ICEM-CE) modelling method proposed in standard IEC62433-2 can target various active chips, but lacks specificity for chips with typical characteristics of electromagnetic compatibility. In this paper, we propose a parametric model construction method for microcontroller units (MCUs). By studying the characteristics of the internal activity (IA) of the MCUs, the universal prior information for MCUs is obtained, and the parameterized model is constructed.
AB - In order to predict the conduction emission performance of a circuit board, manufacturers need to provide the electromagnetic compatibility (EMC) model of the chip to users. The Integrated circuit emission model-conducted emissions (ICEM-CE) modelling method proposed in standard IEC62433-2 can target various active chips, but lacks specificity for chips with typical characteristics of electromagnetic compatibility. In this paper, we propose a parametric model construction method for microcontroller units (MCUs). By studying the characteristics of the internal activity (IA) of the MCUs, the universal prior information for MCUs is obtained, and the parameterized model is constructed.
KW - Elecomagnetic compatibility
KW - conducted emission
KW - microcontroller units
KW - parametric model
UR - https://www.scopus.com/pages/publications/85132976428
U2 - 10.1109/iWEM53379.2021.9790696
DO - 10.1109/iWEM53379.2021.9790696
M3 - 会议稿件
AN - SCOPUS:85132976428
T3 - IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2021 - Proceedings
BT - IEEE International Workshop on Electromagnetics
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2021 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2021
Y2 - 28 November 2021 through 30 November 2021
ER -