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A new method for power flicker measurement based on interpolated DFT

  • Jin Haibin*
  • , Bin Wang
  • , Jing Wu
  • , Kai Jia
  • *此作品的通讯作者
  • Beijing Orient Institute of Metrology and Measurement Technology
  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Measuring power flicker is important in assessing the quality of the electric power. This paper introduces a new method on measuring the modulation ratio of voltage in flicker. We divide the samples of the fluctuating voltage into several groups according to its period. Then the interpolated discrete Fourier transform(DFT) based on Hanning window is used to analyze the rms of each period of samples. All of rms are sorted from small to large. The maximum and minimum rms are used to calculate the modulation ratio of the flicker. The simulation results show that the accuracy of the proposed method is high and it has a rapid computation speed.

源语言英语
主期刊名2011 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2011 - Proceedings
221-224
页数4
DOI
出版状态已出版 - 2011
活动2011 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2011 - Binjiang, Hangzhou, 中国
期限: 10 5月 201112 5月 2011

出版系列

姓名Conference Record - IEEE Instrumentation and Measurement Technology Conference
ISSN(印刷版)1091-5281

会议

会议2011 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2011
国家/地区中国
Binjiang, Hangzhou
时期10/05/1112/05/11

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