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A new analytical inversion to Fraunhofer diffraction

  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

An analytical inversion to the particle sizing problem in Fraunhofer diffraction was introduced in this paper. Compared with the well known Chin-Shifrin inversion, it is an inversion of the integral transform and less sensitive to the noise. Simulation results with 0.1% noise were obtained and show that the new inversion performs well even in the case of noisy data, where the Chin-Shifrin method does not converge.

源语言英语
主期刊名2009 IEEE Intrumentation and Measurement Technology Conference, I2MTC 2009
507-510
页数4
DOI
出版状态已出版 - 2009
活动2009 IEEE Intrumentation and Measurement Technology Conference, I2MTC 2009 - Singapore, 新加坡
期限: 5 5月 20097 5月 2009

出版系列

姓名2009 IEEE Intrumentation and Measurement Technology Conference, I2MTC 2009

会议

会议2009 IEEE Intrumentation and Measurement Technology Conference, I2MTC 2009
国家/地区新加坡
Singapore
时期5/05/097/05/09

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