A Horn-Tip Ultrawideband E-Probe for Radiated EMI Measurements Up To 50 GHz

Based on a new Horn-Tip structure, this paper introduces a new design for an ultrawideband electric field probe working from 10 kHz up to 50 GHz for better Electromagnetic Compatibility EMC and diagnosis of Electromagnetic Interference EMI. The tip design is based on a Horn shape to enhance and improve the probe efficiency and sensitivity. The probe has been designed on a 4-layer PCB. The probe is divided into 3-parts, the induction part which has the horn-tip structure, the transmission part which is designed by a stripline structure using high-performance dielectrics 'Rogers RO4003 (tm)' and 'RO4450' with relative permittivity ϵ_r3.55 and 3.3 respectively, and the output part. The probe length is 60 mm with a minimum tip width of 4 mm which is suitable for the narrow and complex PCBs. The stripline transmission part is designed with a slope structure to achieve a good field distribution and enhance impedance matching, resulting in ultra-wide bandwidth scanning. The transfer gain sensitivity is -20 dB at 9 GHz which is about 6 dB higher than some referenced and introduced probes. The spatial resolution is a very narrow result of 0.58 mm when the probe is 0.3 mm above the DUT.